MicroSense says that they see an increase in orders for its MRAM magnetic metrology systems. MicroSense's metrology tools characterize the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. They offer a 300mm Polar Kerr (out-of-plane) MRAM metrology system, the KerrMapper (in-plane) tool and Vibrating Sample Magnetometers (VSM) for MRAM makers.
The company has been selling Gen-1 MRAM metrology tools since 2004. They say that now, with the recent developments in STT-MRAM, they see a number of new MRAM tool orders.
Posted: Jun 21,2012 by Ron Mertens
