Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells From Days to Hours

Agilent Technologies today announced new hardware and software capabilities for its B1500A Semiconductor Device Analyzer and EasyEXPERT software test shell, which reduce the time required for the testing and characterization of advanced non-volatile memory (NVM) cells and other next-generation semiconductor devices.

The Agilent B1500A meets the industry’s need for an instrument-based solution that supports modern NVM technology requirements, including MRAM, PRAM, RRAM, NAND and NOR Flash, such as support for voltages greater than 20 V and precise control over the pulse level, and leading and trailing edges. The B1500A with EasyEXPERT and the HV-SPGU is designed to allow users to complete endurance testing of NVM cells up to 10 times faster than with previous solutions.

Posted: Apr 18,2007 by Ron Mertens