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The process of establishing the function and scalability of the multi-bit MRAM has followed a sequence of first productizing the magnetic storage element (the âyokeâ), followed by Hall Cross Sensor characterization, and finally integrated MRAM bit cell performance. With this very successful demonstration of the magnetic structure, Strategic Solutions has characterized the relative efficacy of two alternative methods: electroplating ersus sputter deposition, as they relate to the ultimate manufacturing of MRAM product in a dense multi-bit array.
Similar data and a milestone for Hall Cross Sensors should be seen in November. A demonstration of a fully integrated MRAM storage cell is expected by year end. Micromem is in discussion with a major military-focused company that provides GaAs space-based platforms. Discussions are centered around the proposed MRAM architecture and how it will benefit their current product line in a dense memory array format.
Posted: Nov 02,2007 by Ron Mertens