ISI released the world's first fully integrated STT-MRAM wafer-level analyzer
Integral Solutions International (ISI) released today a new wafer-level analyzer for STT-MRAM characterization, the WLA-3000. They say that this is the world's first commercially available and fully integrated solution to address the needs of production level testing of STT-MRAM wafers.
The WLA-3000 includes proprietary magnets, pulse generator module, probecard interfaces, and measurement electronics that were all specifically developed by ISI. ISI says they already shipped several of these testers which have now been qualified for high volume production testing of STT-MRAM devices.